Schedule of user tests of prototype AIDA hardware
-------------------------------------------------

Assumes:

	completion of basic acceptance tests by STFC RAL

	recommended ASIC configuration per above tests

	operational FEE

There will probably be at least some overlap between the
acceptance and user tests.

Instrumentation only			benchtop
--------------------

noise			20MeV/1GeV/20GeV		pulser
gain				"			pulser + charge terminator
INL				"			pulser
DNL				"			pulser + ramp
threshold			"			pulser
rate				"			pulser + random trigger
crosstalk			"			pulser
ballistic 			"			pulser
multiplicity			"			pulser

Instrumentation + detector		benchtop + GSI
--------------------------

All of the above

energy resolution		20MeV			207Bi/241Am
linearity			"			207Bi/241Am
threshold			"			207Bi/241Am
timing				"			207Bi + BaF2
rate				"			207Bi
pulse shape			"			207Bi

Instrumentation + detector + beam	GSI
---------------------------------

fast decay
	overload recovery
	readout & reset sequence timing

correlation
	implant - decay
	decay -decay
	upstream (e.g. MUSIC, dE) - implant

crosstalk/multiplicity	20MeV/1GeV/20GeV
	intra-/inter- ASIC effects
	inter-strip effects

radiation damage
	leakage current
	energy resolution
	time resolution
	threshold	


Ancilliary equipment
--------------------

Pulser	BNC PB-4
Ramp	BNC LG-1
Random	BNC DB-2
Fast gamma-ray detector		BaF2 + XP2020Q PMT + base
				EG&G Ortec CFD
207Bi	conversion electron source
	continuum electron spectrum + discrete electron peaks @ 481.7keV (K), 975.1keV (KeV) + gamma-rays

241Am	X-ray (<30keV) / low-energy gamma-ray (60keV) source